NEID Data Bitfields¶
Overview¶
Beginning in v1.2.0, the NEID DRP uses bitfields contained in header keywords DQLEVEL0, DQLEVEL1, DQLEVEL2 to compactly provide information about the data that may be useful to end users. This data is packaged as a series of nested bit-fields, as defined below, and stored in the header as an int. Each field contains up to 64 bits, although many will be unpopulated (i.e., 0).
Each byte is dedicated to a specific DRP subsystem, and the 2 least-significant-bits of each byte contain rollup assessments of the data in the following 6 bits.
The least-significant-byte contains rollup information from the other bytes. Bits 0-1 contain an overall data quality assessment, as follows:
0: Pass
1: Warn
2: Fail
Bits not listed in the below tables are reserved for future use.
DQLEVEL0¶
Not currently used
DQLEVEL1¶
Byte |
Bit |
Description |
---|---|---|
0 |
0-1 |
|
1 |
Manual Assessment Bits |
|
1 |
8-9 |
|
1 |
10-15 |
|
2 |
Automated Hardware Assessment |
|
2 |
16-17 |
Summary Assessment |
2 |
18 |
Port illumination failure |
2 |
19 |
Calibration illumination failure |
3 |
Run Information/Manifest |
|
3 |
24-25 |
|
3 |
26-27 |
|
4 |
CCD Image Processing Assessment |
|
4 |
32-33 |
Summary Assessment |
4 |
34 |
|
5 |
Extraction |
|
5 |
40-41 |
Summary Assessment |
5 |
42 |
|
6 |
Wavelength Calibration |
|
6 |
48-49 |
|
6 |
50 |
|
6 |
51 |
|
DQLEVEL2¶
Byte |
Bit |
Description |
---|---|---|
2 |
Telluric Model |
|
2 |
16-17 |
Summary Assessment |
2 |
18 |
|
Last Updated, 2025-02-18, DMK